Thermal-aware testing of digital VLSI circuit and systems / (Record no. 27456)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00587nam a22001817a 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 260127b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780815378822 |
| 100 ## - MAIN ENTRY--AUTHOR | |
| Author | Chattopadhyay, S. |
| 245 ## - TITLE STATEMENT | |
| Title | Thermal-aware testing of digital VLSI circuit and systems / |
| Statement of responsibility, etc | Santanu, C. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boca Raton |
| Name of publisher | C R C |
| Date of publication | 2018 |
| 300 ## - COLLATION | |
| Pagination | xix, 117p. :ill. ; |
| Other physical details | Hbk. |
| 650 ## - TRACINGS | |
| Main Subject | Integrated circuits--very large scale integration--testing |
| 650 ## - TRACINGS | |
| Main Subject | Digital integrated circuits--testing |
| 650 ## - TRACINGS | |
| Main Subject | Integrated circuit |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Item type | Books |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7874.75.C4 2018 |
| Source of classification or shelving scheme | Not for loan | Permanent location | Current location | Shelving location | Date acquired | Full call number | Barcode. | Koha item type |
|---|---|---|---|---|---|---|---|---|
| Library of Congress Classification | Main LIbrary | Main LIbrary | General stacks | 01/27/2026 | TK7874.75.C4 2018 | 2026-0297 | Books | |
| Library of Congress Classification | Main LIbrary | Main LIbrary | General stacks | 01/27/2026 | TK7874.75.C4 2018 | 2026-0299 | Books |