Chattopadhyay, S. <br/><br/>
Thermal-aware testing of digital VLSI circuit and systems / 
Santanu, C. 
 - Boca Raton  C R C  2018 
 - xix, 117p. :ill. ;  Hbk. 
<br/><br/><label>ISBN: </label>9780815378822 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--very large scale integration--testing<br/>Digital integrated circuits--testing<br/>Integrated circuit
<br/><br/><label>LC Class. No.: </label>TK7874.75.C4 2018