TY  - BOOK
AU  - Chattopadhyay, S.
TI  - Thermal-aware testing of digital VLSI circuit and systems
SN  - 9780815378822
AV  - TK7874.75.C4 2018 
PY  - 2018///
CY  - Boca Raton
PB  - C R C
KW  - Integrated circuits--very large scale integration--testing
KW  - Digital integrated circuits--testing
KW  - Integrated circuit
ER  -