000			00587nam a22001817a 4500
005			20260127124923.0
008			260127b |||||||| |||| 00| 0 eng d
020			_a9780815378822
050			_aTK7874.75.C4 2018
100			_aChattopadhyay, S.
245			_aThermal-aware testing of digital VLSI circuit and systems / _cSantanu, C.
260			_aBoca Raton _bC R C _c2018
300			_axix, 117p. :ill. ; _bHbk.
650			_aIntegrated circuits--very large scale integration--testing
650			_aDigital integrated circuits--testing
650			_aIntegrated circuit
942			_cBK
999			_c27456 _d27456