Thermal-aware testing of digital VLSI circuit and systems / Santanu, C.
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TextPublication details: Boca Raton C R C 2018Description: xix, 117p. :ill. ; HbkISBN: - 9780815378822
- TK7874.75.C4 2018
| Item type | Current library | Call number | Status | Barcode | |
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Main LIbrary General stacks | TK7874.75.C4 2018 (Browse shelf(Opens below)) | Available | 2026-0297 | |
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Main LIbrary General stacks | TK7874.75.C4 2018 (Browse shelf(Opens below)) | Available | 2026-0299 |
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