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Thermal-aware testing of digital VLSI circuit and systems / Santanu, C.

By: Material type: TextPublication details: Boca Raton C R C 2018Description: xix, 117p. :ill. ; HbkISBN:
  • 9780815378822
Subject(s): LOC classification:
  • TK7874.75.C4 2018
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Item type Current library Call number Status Barcode
Books Main LIbrary General stacks TK7874.75.C4 2018 (Browse shelf(Opens below)) Available 2026-0297
Books Main LIbrary General stacks TK7874.75.C4 2018 (Browse shelf(Opens below)) Available 2026-0299

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